DE3783766D1 - Atto-amperemessgeraet. - Google Patents

Atto-amperemessgeraet.

Info

Publication number
DE3783766D1
DE3783766D1 DE8787113324T DE3783766T DE3783766D1 DE 3783766 D1 DE3783766 D1 DE 3783766D1 DE 8787113324 T DE8787113324 T DE 8787113324T DE 3783766 T DE3783766 T DE 3783766T DE 3783766 D1 DE3783766 D1 DE 3783766D1
Authority
DE
Germany
Prior art keywords
ampeter
atto
atto ampeter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8787113324T
Other languages
English (en)
Other versions
DE3783766T2 (de
Inventor
Hans-Werner Dr Fink
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE3783766D1 publication Critical patent/DE3783766D1/de
Application granted granted Critical
Publication of DE3783766T2 publication Critical patent/DE3783766T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
DE8787113324T 1987-09-11 1987-09-11 Atto-amperemessgeraet. Expired - Fee Related DE3783766T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP87113324A EP0306552B1 (de) 1987-09-11 1987-09-11 Atto-Amperemessgerät

Publications (2)

Publication Number Publication Date
DE3783766D1 true DE3783766D1 (de) 1993-03-04
DE3783766T2 DE3783766T2 (de) 1993-07-08

Family

ID=8197274

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787113324T Expired - Fee Related DE3783766T2 (de) 1987-09-11 1987-09-11 Atto-amperemessgeraet.

Country Status (4)

Country Link
US (1) US4804909A (de)
EP (1) EP0306552B1 (de)
JP (1) JPH071282B2 (de)
DE (1) DE3783766T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5153502A (en) * 1991-09-12 1992-10-06 The United States Of America As Represented By The United States Department Of Energy Low noise charge ramp electrometer
JP3129820B2 (ja) * 1992-03-04 2001-01-31 シスメックス株式会社 粒子検出装置
US5502297A (en) * 1992-10-22 1996-03-26 Intermec Corporation Method and apparatus for detecting the presence of a surface bearing a bar code symbol
US6414318B1 (en) 1998-11-06 2002-07-02 Bridge Semiconductor Corporation Electronic circuit
WO2000028337A2 (en) 1998-11-06 2000-05-18 Onguard Systems, Inc. Electronic circuit with a non-continuous discharge path
EP1897521A1 (de) * 2006-09-05 2008-03-12 The Procter and Gamble Company Absorbierende Artikel mit elastischer, oberer Schicht und reduziertem Überlaufen
EP1936390A1 (de) * 2006-12-20 2008-06-25 Ecole Polytechnique Federale De Lausanne Epfl - Sti - Imm - Lmis3 Halbleiterbauteil zum Messen von ultra kleinen elektrischen Strömen und kleinen Spannungen
EP1992367B1 (de) 2007-05-15 2012-06-27 The Procter & Gamble Company Saugfähiger Artikel mit einer Lotionszusammensetzung zur Reduktion von Fäkal- oder Mensesanhaftung an der Haut
EP1992366B1 (de) * 2007-05-15 2011-07-06 The Procter & Gamble Company Verwendung einer Lotionszusammensetzung auf einem saugfähigen Artikel zur Reduktion von Fäkal- oder Mensesanhaftung an der Haut
US20080287896A1 (en) * 2007-05-15 2008-11-20 The Procter & Gamble Company Absorbent Article With Hydrophilic Lotion And High Barrier Cuffs

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1172370B (de) * 1961-09-30 1964-06-18 Siemens Ag Einrichtung zum Messen des spezifischen elektrischen Widerstandes eines Laengen-abschnittes eines stabfoermigen Halbleiterkoerpers
US3321628A (en) * 1964-09-18 1967-05-23 James E Webb Baseline stabilization system for ionization detector
US3808494A (en) * 1968-12-26 1974-04-30 Matsushita Electric Ind Co Ltd Flexible channel multiplier
US3679973A (en) * 1970-10-20 1972-07-25 Us Interior Electrogasdynamic dust monitor
US3752987A (en) * 1971-03-29 1973-08-14 Bendix Corp System for detecting high energy electromagnetic radiation
US3790840A (en) * 1972-03-31 1974-02-05 Murata Manufacturing Co Secondary electron multiplying device using semiconductor ceramic
CH643397A5 (de) * 1979-09-20 1984-05-30 Ibm Raster-tunnelmikroskop.
US4335304A (en) * 1980-07-31 1982-06-15 The Perkin-Elmer Corporation Signal detection mechanism from electron multiplier
JPS60121657A (ja) * 1983-11-11 1985-06-29 Anelva Corp 測定装置

Also Published As

Publication number Publication date
JPH01132970A (ja) 1989-05-25
JPH071282B2 (ja) 1995-01-11
US4804909A (en) 1989-02-14
EP0306552A1 (de) 1989-03-15
DE3783766T2 (de) 1993-07-08
EP0306552B1 (de) 1993-01-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee