CN117054948A - Stability analysis method and system for integrated circuit test equipment - Google Patents
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Abstract
A stability analysis method and system for integrated circuit test equipment belongs to the technical field of integrated circuit test and solves the problem that the existing integrated circuit test equipment lacks long-term detection and test; collecting test data of integrated circuit test equipment, preprocessing the test data, obtaining a complete data set by removing test abnormal data and processing missing test data, grouping and numbering the test data, defining a qualified interval, judging the qualification of each group of test data, judging whether the test data is in a preset qualified interval range, counting the number of unqualified test data, setting a threshold value, alarming and detecting the test data, and outputting alarm information; the stability evaluation capability of the test equipment is improved, and the accuracy and stability of the test result are ensured.
Description
Technical Field
The invention belongs to the technical field of integrated circuit testing, and relates to a stability analysis method and system of integrated circuit testing equipment.
Background
The integrated circuit test equipment is special instrument equipment for testing the integrated circuit, is used for testing and analyzing the chip in the production process of the integrated circuit, and is a key means for ensuring the performance and quality of the integrated circuit. Integrated circuit test equipment and stability analysis of the test equipment are developed based on the development of the prior art such as automatic test technology, test system software and hardware technology and the like, and with the increasingly complex and high performance requirements of integrated circuits, the test equipment is required to continuously improve the test capability and stability so as to meet the requirements of chip manufacturing. Meanwhile, the development of stability analysis technology is also helpful to ensure the long-term reliability and performance consistency of the test equipment and improve the reliability and accuracy of the test result. Therefore, research on the stability analysis method of the integrated circuit testing device is also crucial. The integrated circuit test equipment stability analysis includes the following aspects:
(1) Long-term stability test: by operating the test equipment for a long time and monitoring the performance of the test equipment, whether the test equipment has performance fluctuation or drift in the long-term use process is estimated;
(2) And (3) environmental suitability test: testing the test equipment under different temperature and humidity conditions, monitoring the performance and response of the equipment, and determining the safety and stability of the equipment under different environments by comparing and analyzing the test data;
(3) And (3) testing power stability: the method comprises the steps of detecting stability of a power supply of test equipment, including detecting stability of voltage and current of the power supply, power factors and the like, and evaluating influence of the power supply of the equipment on the stability of the equipment by monitoring and recording relevant parameters of the power supply, comparing and analyzing the performance of the equipment with a test result;
(4) Periodic calibration and maintenance: checking whether the functions and performances of the equipment are consistent with the standard specifications, carrying out necessary calibration and adjustment, maintaining the cleaning equipment, replacing consumable materials and parts, carrying out preventive maintenance and the like, and carrying out regular calibration and maintenance can ensure that the performances and the stability of the equipment are maintained and reduce the occurrence of faults and inaccurate results.
The implementation of the method needs to comprehensively test the characteristics of equipment, the requirements of production environment and the requirements of a quality management system, and by adopting the method and combining data analysis and evaluation, the stability of the test equipment is improved, and the accuracy and consistency of the test result of the equipment are ensured.
The method for carrying out visual analysis on the test data of the integrated circuit by using Python is disclosed in the literature (Zhang Penghui, zhang Huibin. Electronics and packaging, 2018 (A1): 53-59.) and can be applied to data files output by various test systems to obtain a preliminary visual analysis result, and has obvious technical progress significance in the field of integrated circuit testing compared with the common data analysis method in the field of integrated circuit testing at present. However, the existing test method still has the problem of insufficient long-term stability test, and the existing test method has insufficient long-term test to verify the stability of the equipment, and can only be used for a limited test time, so that the evaluation of the long-term stability of the test equipment is inaccurate.
Disclosure of Invention
The technical scheme of the invention is used for solving the problem that the existing integrated circuit testing equipment lacks long-term detection and testing.
The invention solves the technical problems through the following technical scheme:
a method of stability analysis of an integrated circuit test device, comprising:
s1, collecting test data of integrated circuit test equipment;
s2, preprocessing the test data, and obtaining a complete data set by removing the test abnormal data and processing the missing test data;
s3, grouping and numbering the test data;
s4, defining a qualified interval, and judging the qualification of each group of test data, and judging whether the test data is in a preset qualified interval range;
s5, counting the quantity of unqualified test data;
s6, setting a threshold value and carrying out alarm detection on the test data;
s7, outputting alarm information.
Further, the method of processing missing test data in S2 is median filling.
Further, the method for grouping and numbering the test data in S3 is as follows:
s31, grouping each column of test data by taking a plurality of data points as a group;
s32, numbering each column of test data and each group of test data.
Further, the method for defining the qualified interval and performing qualification judgment on each group of test data and judging whether the test data is within the preset qualified interval in S4 is as follows:
s41, defining a qualified test data interval;
s42, judging the test data to be qualified if the group of test data is located in the defined qualified interval; and if the group of test data exceeds the defined qualified interval, judging that the test data is unqualified.
Further, the method for counting the number of unqualified test data in S5 is as follows:
s51, circulating each column of test data, and initializing a group number and a starting index of unqualified test data;
s52, each group of test data is circulated, and the group numbers and the number of the unqualified test data are obtained from the start index to the end index of each group of test data.
Further, the method for setting the threshold and performing alarm detection on the test data in S6 is as follows:
s61, defining an alarm threshold;
and S62, triggering an alarm if the number of the unqualified test data in a certain group exceeds a defined threshold, and not triggering the alarm if the number of the unqualified test data in the certain group does not exceed the defined threshold.
Further, the outputting alarm information in S7 includes: and outputting the column number of the corresponding test data, the group number of the disqualified test data and the quantity of the disqualified test data.
Further, the method for outputting alarm information in S7 is as follows:
s71, defining an alarm list for storing alarm information and initializing the alarm list;
s72, if the alarm is triggered, adding alarm information into an alarm list; if the alarm is not triggered, the next group of test data is circulated; and outputting an alarm list until the circulation is finished.
An integrated circuit test equipment stability analysis system comprising: the system comprises a data acquisition module, a data preprocessing module, a data grouping module, a data compliance judging module, a disqualification data statistics module, a data alarm detection module and an alarm information output module;
the data acquisition module is used for acquiring test data of the integrated circuit test equipment;
the data preprocessing module is used for preprocessing the test data and obtaining a complete data set by removing the test abnormal data and processing the missing test data;
the data grouping module is used for grouping and numbering the test data;
the data compliance judging module is used for defining a qualified interval and judging the qualification of each group of test data, and judging whether the test data are in a preset qualified interval range or not;
the unqualified data statistics module is used for counting the number of unqualified test data;
the data alarm detection module is used for setting a threshold value and carrying out alarm detection on the test data;
the alarm information output module is used for outputting alarm information.
Further, the method for processing missing test data in the data preprocessing module is median filling.
The invention has the advantages that: the method has the advantages that the collected test data are read according to the columns, the data are grouped according to a certain rule, the qualification judgment is carried out on each group of data, the quantity of unqualified data is counted, the alarm detection is carried out according to the set threshold value, and the method has the following advantages:
(1) The intelligent processing and the abnormal detection of the test data are realized, and the detection efficiency of the stability of the test equipment is improved;
(2) According to multidimensional data analysis, the stability of the equipment is evaluated by considering a plurality of test parameters and data of a plurality of time points;
(3) The method has the advantages that the test data are acquired and processed in real time and an alarm is given out in time when the equipment is in operation, the problem of equipment stability is found in time, measures are taken to adjust and repair, the stability evaluation capability of the test equipment is improved, and the accuracy and stability of a test result are ensured.
Drawings
FIG. 1 is a flow chart of a method and system for analyzing stability of an integrated circuit test device according to an embodiment of the present invention;
FIG. 2 is a flow chart of a method and system for analyzing stability of an integrated circuit test device according to an embodiment of the present invention for counting the number of failed test data;
FIG. 3 is a diagram of output alarm information of an integrated circuit test device stability analysis method and system according to an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions in the embodiments of the present invention will be clearly and completely described in the following in conjunction with the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The technical scheme of the invention is further described below with reference to the attached drawings and specific embodiments:
example 1
As shown in fig. 1 to 2, in particular, the present embodiment discloses a method for analyzing stability of an integrated circuit testing device, which includes,
s1, collecting test data of integrated circuit test equipment.
Test data of the integrated circuit test equipment is first collected, and in this embodiment, the specific test data may include various test parameters, measurement results, and the like of the integrated circuit test equipment.
In this embodiment, stability analysis is performed on test data collected from test equipment by using a running environment based on Python 3.9+pycharm in a Windows operation platform, the collected data is named as testdata1, each column of 2856 data includes 7 columns of data, the data types are floating point type, and part of the data are shown in the following table:
s2, preprocessing the test data, and obtaining a complete data set by removing the test abnormal data and processing the missing test data.
And preprocessing the collected test data to ensure the accuracy and the integrity of the data, wherein the preprocessing means comprises the steps of removing test abnormal data and processing missing test data, and particularly, the method for processing the missing test data is median filling.
When analyzing the collected test data, the situation of data missing values is often encountered, if the data sample size is small, the row or column containing the missing values can be deleted, but when the data size is very large, the deletion of the missing values can cause a great reduction of the data size, and the analysis result is affected; in order to retain as much data as possible in this embodiment, the missing column values are padded with a median, e.g., the median is set by a filena () function, the upper half and the lower half of the test data are separated by the median, and the missing data is padded with the median.
In this embodiment, the data in testdata1 is preprocessed, the missing values in the data set are supplemented by a median filling means, and the processed data set is named q_testdata1.
S3, grouping and numbering the test data;
s31, grouping each column of test data by taking N data points as a group;
and S32, numbering each column of test data and each group of test data, and defining a column number column_number=M, wherein the number of each group of data is group_size=N.
In this embodiment, each column of test data is grouped into a group of every 100 data points, and each group of test data is numbered, and a column count_count=7 is defined, and a data number group_size=100 for each group, that is, in this embodiment, 7 columns of data exist, and each column of data is numbered with 100 data as a group of data.
S4, defining a qualified interval, and judging the qualification of each group of test data, and judging whether the test data is in a preset qualified interval range;
s41, defining a qualified interval lower_limit=a, upper_limit=b;
s42, judging the test data to be qualified if the group of test data is located in the defined qualified interval; and if the group of test data exceeds the defined qualified interval, judging that the test data is unqualified.
In this embodiment, according to the known conditions when data are collected, lower_limit= -900 and upper_limit= -200 are defined, that is, the defined data are qualified data in the interval from-900 to-200, whether each data are in the defined qualified interval range is checked by a conditional statement, and if the group of test data are in the defined qualified interval, the group of test data are judged to be qualified test data; and if the group of test data exceeds the defined qualified interval, judging that the test data is unqualified.
S5, counting the quantity of unqualified test data;
s51, circulating each column of test data, and initializing a group number and a starting index of unqualified test data;
s52, each group of test data is circulated, and the group numbers and the number of the unqualified test data are obtained from the start index to the end index of each group of test data.
In this embodiment, in order to count the number of data of the failed test in each group, each column of test data is circulated, the group number group_number of the failed test data is defined and initialized to be 1, the start index start_index of the test data is 0, each group of test data is started to be circulated, the end index end_index in the current group is calculated, a new data group group_data is defined and acquired through the start_index to the end_index in the current group, and the number count of the failed test data in the current group is counted.
S6, setting a threshold value and carrying out alarm detection on the test data;
s61, defining an alarm threshold=z;
and S62, triggering an alarm if the number of the unqualified data in a certain group exceeds a defined threshold, and not triggering the alarm if the number of the unqualified data in the certain group does not exceed the defined threshold.
In this embodiment, after multiple tests and data statistics, defining threshold=2 as an alarm threshold, comparing the number count of unqualified test data in each group counted in step S5 with the alarm threshold, and if the number count of unqualified test data in the group is greater than the alarm threshold, triggering an alarm; if the number count of the unqualified test data in the group is smaller than the alarm threshold value threshold, the unqualified data in the next group is continuously compared with the alarm threshold value.
S7, outputting alarm information.
The outputting alarm information in S7 includes: and outputting a column number column_number corresponding to the test data, a group number group_number corresponding to the test data and the number count of the unqualified test data in the corresponding test data group.
S71, defining an alarm list alarms for storing alarm information and initializing the alarm list;
s72, if the alarm is not triggered, circulating the next group of test data; if the alarm is triggered, adding alarm information (column_number, group_number, count) to the alarm list until the cycle is finished, and outputting the total alarm information.
In this embodiment, by defining an empty list alarms [ ] as an alarm list for storing alarm information, when an alarm is triggered in step S6, alarm information (column_number, group_number, count) is added to the alarms [ ] list; when the alarm is not triggered, the next group of test data is circulated to carry out alarm detection; after all groups are subjected to alarm detection, alarmes [ ] is output as alarm information, and the alarm information output in the embodiment is shown as a figure 3, and as can be seen from the figure, in the collected 7-column test data, the number of the test data unqualified data positioned in the 27 th to 29 th groups can exceed a set threshold value and the alarm information is output; in this embodiment, when the machine detects the stability of the chips to 2700-2900 chips, the test device starts to have stability problems, and the stability detection and adjustment of the machine are required, so that the long-term operation detection test and stability analysis of the test device can be realized based on the above method.
Example two
As shown in fig. 1 to 2, the present embodiment discloses a stability analysis system of an integrated circuit test apparatus, including: the system comprises a data acquisition module, a data preprocessing module, a data grouping module, a data compliance judging module, a disqualification data statistics module, a data alarm detection module and an alarm information output module;
the data acquisition module is used for acquiring test data of the integrated circuit test equipment;
test data for the integrated circuit test equipment is collected, and in this embodiment, the specific test data may include various test parameters, measurement results, and the like of the integrated circuit test equipment.
In this embodiment, stability analysis is performed on test data collected from test equipment by using a running environment based on Python 3.9+pycharm in a Windows operation platform, the collected data is named as testdata1, each column of 2856 data includes 7 columns of data, the data types are floating point type, and part of the data are shown in the following table:
| 1 | -453.6938 | -455.0068 | ...... | -538.2089 | -496.5793 |
| 2 | -455.5767 | -457.5727 | ...... | -537.2968 | -496.1483 |
| 3 | -455.3819 | -455.5265 | ...... | -538.8086 | -497.3227 |
| ...... | ...... | ...... | ...... | ...... | ...... |
| 2854 | -439.7996 | -439.5464 | ...... | -530.2124 | -497.0416 |
| 2855 | -443.4679 | -442.4046 | ...... | -531.868 | -497.7724 |
| 2856 | -446.0650 | -445.8150 | ...... | -532.4052 | -497.7787 |
the data preprocessing module is used for preprocessing the test data and obtaining a complete data set by removing the test abnormal data and processing the missing test data; the method for processing the missing test data is median filling.
And preprocessing the collected test data to ensure the accuracy and the integrity of the data, wherein the preprocessing means comprises the steps of removing test abnormal data and processing missing test data, and particularly, the method for processing the missing test data is median filling.
When analyzing the collected test data, the situation of data missing values is often encountered, if the data sample size is small, the row or column containing the missing values can be deleted, but when the data size is very large, the deletion of the missing values can cause a great reduction of the data size, and the analysis result is affected; in order to retain as much data as possible in this embodiment, the missing column values are padded with a median, e.g., the median is set by a filena () function, the upper half and the lower half of the test data are separated by the median, and the missing data is padded with the median.
In this embodiment, the data in testdata1 is preprocessed, the missing values in the data set are supplemented by a median filling means, and the processed data set is named q_testdata1.
The data grouping module is used for grouping and numbering the test data;
grouping each column of test data with N data points as a group;
each column of test data and each group of test data are numbered, and the column number column_number=m and the data number group_size=n of each group are defined.
In this embodiment, each column of test data is grouped into a group of every 100 data points, and each group of test data is numbered, and a column count_count=7 is defined, and a data number group_size=100 for each group, that is, in this embodiment, 7 columns of data exist, and each column of data is numbered with 100 data as a group of data.
The data compliance judging module is used for defining a qualified interval and judging the qualification of each group of test data, and judging whether the test data are in a preset qualified interval range or not;
defining a qualified interval lower_limit=a and upper_limit=b;
if the group of test data is located in the defined qualified interval, judging the group of test data to be qualified test data; and if the group of test data exceeds the defined qualified interval, judging that the test data is unqualified.
In this embodiment, according to the known conditions when data are collected, lower_limit= -900 and upper_limit= -200 are defined, that is, the defined data are qualified data in the interval from-900 to-200, whether each data are in the defined qualified interval range is checked by a conditional statement, and if the group of test data are in the defined qualified interval, the group of test data are judged to be qualified test data; and if the group of test data exceeds the defined qualified interval, judging that the test data is unqualified.
The unqualified data statistics module is used for counting the number of unqualified test data;
each column of test data is circulated, and the group number and the initial index of the unqualified test data are initialized;
and circulating each group of test data, calculating the starting index to the ending index of each group of test data, and obtaining the group number of the unqualified test data and the quantity of the unqualified test data.
In this embodiment, in order to count the number of data of the failed test in each group, each column of test data is circulated, the group number group_number of the failed test data is defined and initialized to be 1, the start index start_index of the test data is 0, each group of test data is started to be circulated, the end index end_index in the current group is calculated, a new data group group_data is defined and acquired through the start_index to the end_index in the current group, and the number count of the failed test data in the current group is counted.
The data alarm detection module is used for setting a threshold value and carrying out alarm detection on the test data;
defining an alarm threshold=z;
triggering an alarm if the number of the unqualified data in a certain group exceeds a defined threshold value, and not triggering the alarm if the number of the unqualified data in the certain group does not exceed the defined threshold value.
In this embodiment, after multiple tests and data statistics, defining threshold=2 as an alarm threshold, comparing the number count of unqualified test data in each group counted in the unqualified data statistics module with the alarm threshold, and if the number count of unqualified test data in the group is greater than the alarm threshold, triggering an alarm; if the number count of the unqualified test data in the group is smaller than the alarm threshold value threshold, the unqualified data in the next group is continuously compared with the alarm threshold value.
The alarm information output module is used for outputting alarm information.
The output alarm information comprises: and outputting a column number column_number corresponding to the test data, a group number group_number corresponding to the test data and the number count of the unqualified test data in the corresponding test data group.
Defining alarm list alarms for storing alarm information and initializing alarm list;
if the alarm is not triggered, the next group of test data is circulated; if the alarm is triggered, adding alarm information (column_number, group_number, count) to the alarm list until the cycle is finished, and outputting the total alarm information.
In this embodiment, by defining an empty list alarmes [ ] as an alarm list, the alarm information is stored, and when the data alarm detection module triggers an alarm, alarm information (column_number, group_number, count) is added to the alarmes [ ] list; when the alarm is not triggered, the next group of test data is circulated to carry out alarm detection; after all groups are subjected to alarm detection, alarmes [ ] is output as alarm information, and the alarm information output in the embodiment is shown as a figure 3, and as can be seen from the figure, in the collected 7-column test data, the number of the test data unqualified data positioned in the 27 th to 29 th groups can exceed a set threshold value and the alarm information is output; in this embodiment, when the machine detects the stability of the chips to 2700-2900 chips, the test device starts to have stability problems, and the stability detection and adjustment of the machine are required, so that the long-term operation detection test and stability analysis of the test device can be realized based on the above method.
The above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for analyzing stability of an integrated circuit test device, the method comprising:
s1, collecting test data of integrated circuit test equipment;
s2, preprocessing the test data, and obtaining a complete data set by removing the test abnormal data and processing the missing test data;
s3, grouping and numbering the test data;
s4, defining a qualified interval, and judging the qualification of each group of test data, and judging whether the test data is in a preset qualified interval range;
s5, counting the quantity of unqualified test data;
s6, setting a threshold value and carrying out alarm detection on the test data;
s7, outputting alarm information.
2. The method of claim 1, wherein the method of processing missing test data in S2 is median fill.
3. The method for analyzing stability of an integrated circuit test device according to claim 1, wherein the method for grouping and numbering test data in S3 is as follows:
s31, grouping each column of test data by taking a plurality of data points as a group;
s32, numbering each column of test data and each group of test data.
4. A method for analyzing stability of an integrated circuit test device according to claim 3, wherein the method for defining a pass interval and performing a pass judgment on each set of test data in S4 to judge whether the test data is within a preset pass interval range is as follows:
s41, defining a qualified test data interval;
s42, judging the test data to be qualified if the group of test data is located in the defined qualified interval; and if the group of test data exceeds the defined qualified interval, judging that the test data is unqualified.
5. The method for analyzing stability of an integrated circuit test device according to claim 4, wherein the method for counting the number of failed test data in S5 is as follows:
s51, circulating each column of test data, and initializing a group number and a starting index of unqualified test data;
s52, each group of test data is circulated, and the group numbers and the number of the unqualified test data are obtained from the start index to the end index of each group of test data.
6. The method for analyzing stability of an integrated circuit testing device according to claim 5, wherein the method for setting a threshold and performing alarm detection on test data in S6 is as follows:
s61, defining an alarm threshold;
and S62, triggering an alarm if the number of the unqualified test data in a certain group exceeds a defined threshold, and not triggering the alarm if the number of the unqualified test data in the certain group does not exceed the defined threshold.
7. The method for analyzing stability of an integrated circuit testing device according to claim 6, wherein said outputting alarm information in S7 comprises: and outputting the column number of the corresponding test data, the group number of the disqualified test data and the quantity of the disqualified test data.
8. The method for analyzing stability of an integrated circuit testing device according to claim 7, wherein the method for outputting alarm information in S7 is as follows:
s71, defining an alarm list for storing alarm information and initializing the alarm list;
s72, if the alarm is triggered, adding alarm information into an alarm list; if the alarm is not triggered, the next group of test data is circulated; and outputting an alarm list until the circulation is finished.
9. An integrated circuit test equipment stability analysis system, comprising: the system comprises a data acquisition module, a data preprocessing module, a data grouping module, a data compliance judging module, a disqualification data statistics module, a data alarm detection module and an alarm information output module;
the data acquisition module is used for acquiring test data of the integrated circuit test equipment;
the data preprocessing module is used for preprocessing the test data and obtaining a complete data set by removing the test abnormal data and processing the missing test data;
the data grouping module is used for grouping and numbering the test data;
the data compliance judging module is used for defining a qualified interval and judging the qualification of each group of test data, and judging whether the test data are in a preset qualified interval range or not;
the unqualified data statistics module is used for counting the number of unqualified test data;
the data alarm detection module is used for setting a threshold value and carrying out alarm detection on the test data;
the alarm information output module is used for outputting alarm information.
10. The system of claim 9, wherein the method of processing missing test data in the data preprocessing module is median fill.
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| US20230056044A1 (en) * | 2021-08-23 | 2023-02-23 | Apple Inc. | Scalable System on a Chip |
| CN115188688A (en) * | 2022-07-25 | 2022-10-14 | 长鑫存储技术有限公司 | Abnormality detection method and apparatus, electronic device, and storage medium |
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