CN110739025A - storage equipment power failure test method, device and system - Google Patents
storage equipment power failure test method, device and system Download PDFInfo
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Abstract
The invention discloses a storage device power failure testing method which comprises the following steps of A1, writing two different preset characteristic data into at least two different preset storage areas of a storage device to be tested, B1, monitoring the data storage state of the storage device while writing the characteristic data, cutting off power supply to the storage device when the storage state of the storage device is in a th state, taking at least preset storage areas as power failure testing areas, and C1, after the power supply to the storage device is recovered, comparing data stored in at least of the at least two different preset storage areas with the preset characteristic data in the corresponding preset storage area.
Description
Technical Field
The invention relates to a storage device testing method, in particular to a power failure testing method, a power failure testing device and a power failure testing system for storage devices.
Background
For the storage device, ensuring reliable storage and stability of data is the key point in the functional attributes of the storage device, and the abnormal power failure test is important scenes for verifying the data storage reliability of the storage device.
In the existing power-down test scheme for storage test, although the test scheme is various, such as introduction of a test system, random power-down time or function increase and the like, when the power-down test is carried out, the power-down test is carried out on the whole system, and a power-down protection strategy cannot be analyzed and formulated according to different data processing states.
Disclosure of Invention
In order to solve the problem that in the prior art, a method of system complete machine power failure is adopted for testing a memory, and a power failure protection strategy cannot be analyzed and formulated according to different data processing states, the invention provides storage equipment power failure testing methods, devices and systems.
, the invention provides a power failure test method for storage devices, which comprises the following steps:
a1, writing two different preset characteristic data into at least two different preset storage areas of the storage device to be tested respectively;
b1, monitoring the data storage state of a storage device while writing characteristic data, cutting off power supply to the storage device when the storage state of the storage device is th state, and taking at least preset storage areas as power failure test areas;
and C1, after the power supply to the storage device is recovered, comparing the data stored in at least of at least two different preset storage areas with the preset characteristic data corresponding to the preset storage areas.
Secondly, the invention provides a power failure test method for storage devices, which comprises the following steps:
a2, establishing a preset mapping relation between data of a storage device to be tested and a storage area, and writing characteristic data into a corresponding storage area in the storage device according to the preset mapping relation, wherein th characteristic data are written into a th preset storage area of the storage device, second characteristic data are written into a second preset storage area of the storage device, and third characteristic data are written into a third preset storage area of the storage device;
b2, monitoring the data storage state of a storage device while writing characteristic data, cutting off power supply to the storage device when the storage state of the storage device is th state, and taking at least of th preset storage area, second preset storage area and third preset storage area as power failure test areas;
and C2, after the power supply to the storage equipment is recovered, searching whether the data different from the th characteristic data, the second characteristic data and the third characteristic data exist in the storage equipment, and after the power supply is recovered, detecting whether the mapping relation between the data in the storage equipment to be tested and the storage area accords with the preset mapping relation.
, before step A2, the method of the present invention further comprises the following steps:
and setting a signal pin on the storage device to be tested.
Further , when the level of the signal pin changes from high to low, the state of the memory device is .
, the method includes cutting off power supply to the memory device at any times, at random times, or according to the data processing state of the memory.
, in the above method according to the present invention, the th default storage area includes the second default storage area and the third default storage area, and the second default storage area and the third default storage area do not overlap.
Thirdly, the invention provides storage device power-down testing apparatuses applying the method described above, including:
a storage device to be tested;
a signal pin connected to the memory device to be tested and outputting at least signals indicating a status of the memory device to be tested;
the controller is connected with the storage equipment to be tested and is used for at least writing preset characteristic data into the storage equipment to be tested, controlling the power supply of the storage equipment to be cut off and restored, reading out data in the storage equipment to be tested, searching whether data different from the th characteristic data, the second characteristic data and the third characteristic data exist in the storage equipment after the power supply of the storage equipment is restored, and detecting whether the mapping relation between the data in the storage equipment to be tested and a storage area accords with the preset mapping relation after the power supply is restored.
Fourthly, the invention provides storage device power-down test systems applying the method and including the storage device power-down test apparatus, including:
the server stores a test program comprising the method;
one or more test nodes, the test nodes being communicatively connected to the server, the test nodes storing therein a test program including the method described above;
one or more storage devices under test, the storage devices connected to the test node, receiving and running test programs transmitted from the test node;
wherein the test node is a child node of the server; and the storage device to be tested is a child node of the test node.
, before the test starts, after transmitting at least test parameters to the server, the test degree associated with the at least test parameters is transmitted to the storage device to be tested and executed.
Finally, the present invention proposes computer-readable storage media having stored thereon a computer program which, when being executed by a processor, carries out the steps of the method as described above.
The method has the advantages that the processing state of the storage equipment on the data is acquired, and then the corresponding equipment power-down protection strategy is tested according to the execution power-down strategy, so that the test coverage is .
Drawings
The invention is further described with reference to the drawings and examples, in which like numerals refer to like parts throughout the several views.
FIG. 1 is a flow chart of an embodiment of a power down test method of storage devices according to the invention;
FIG. 2 is a flow chart illustrating a second embodiment of a power down test method for storage devices according to the invention;
FIG. 3 is a flow chart illustrating a third embodiment of a power down test method for storage devices according to the present invention;
FIG. 4 is a block diagram of a embodiment of an storage device power down test apparatus according to the present invention;
FIG. 5 is a block diagram of a second embodiment of a power down test apparatus for storage devices in accordance with the present invention;
FIG. 6 is an architecture diagram of embodiments of an storage device power down test system in accordance with the present invention;
FIG. 7 is a schematic diagram illustrating the operation of storage device power down test systems according to the present invention.
Detailed Description
The conception, the specific structure and the technical effects of the present invention will be clearly and completely described below in conjunction with the embodiment and the accompanying drawings to fully understand the objects, the schemes and the effects of the present invention. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The same reference numbers will be used throughout the drawings to refer to the same or like parts.
It should be noted that, unless otherwise specified, when a certain feature is referred to as being "fixed" or "connected" to another feature, it may be directly fixed or connected to another feature or indirectly fixed or connected to another feature.
In other instances, well-known structures and techniques have not been shown or described in detail to avoid obscuring the disclosure, like reference numerals in the two or more drawings indicate like or similar elements, hi addition, elements and their associated features, which are described in detail with reference to embodiments, may be included in other embodiments where they are not specifically shown or described, for example, if an element is described in detail with reference to embodiments, and if the element is not described with reference to the second embodiment, it may also be claimed to be included in the second embodiment.
The terms used in the description herein are intended only to describe particular embodiments and are not intended to limit the application, the term "and/or" as used herein includes or any combination of more than one of the associated listed items.
It will be understood that, although the terms , second, third, etc. may be used herein to describe various elements, these elements should not be limited to these terms.
In an embodiment of the present invention, the method steps may be performed in another orders.
Referring to a flowchart of a embodiment of the storage device power-down testing method shown in fig. 1, an exemplary embodiment of the storage device power-down testing method is shown, and the method includes the steps of a1 writing two different preset feature data into at least two different preset storage areas of a storage device to be tested, B1 monitoring a data storage state of the storage device while writing the feature data, cutting off power supply to the storage device when the storage state of the storage device is a th state, and using at least preset storage areas as power-down testing areas, and C1 comparing data stored in at least of the at least two different preset storage areas with preset feature data corresponding to the preset storage areas after power supply to the storage device is recovered.
Preferably, in embodiments of the present invention, before step A1, the method further comprises the step of setting signal pins on the memory device to be tested.
Preferably, in embodiments of the present invention, when the level of the signal pin goes from high to low, the state of the memory device is th state.
Preferably, in embodiments of the present invention, the State is a programming State (programming State), further to , and the State may also be a Sending-data State (Sending-data State) and a receiving-data State (receiving-data State), etc., depending on the data State of the memory to be tested and the corresponding power-down protection policy, without violating the spirit of the present invention.
, in embodiments of the present invention, the method provided by the present invention can perform corresponding power down according to different processing states of the storage device on the data, and further test a corresponding device power down protection policy according to a power down policy executed by the storage device.
, the method includes cutting off power supply to the memory device at any times, at random times, or according to the data processing state of the memory.
Step , referring to a flow chart of a second embodiment of a storage device power-down test method according to the present invention shown in fig. 2, a preferred embodiment of a storage device power-down test method is shown, which includes steps of a2, establishing a preset mapping relationship between data of a storage device to be tested and storage areas, and writing characteristic data into corresponding storage areas in the storage device according to the preset mapping relationship, wherein writing characteristic data into a th preset storage area of the storage device, writing second characteristic data into a second preset storage area of the storage device, and writing third characteristic data into a third preset storage area of the storage device, B2, monitoring a data storage state of the storage device while writing the characteristic data, cutting off power supply to the storage device when the storage state of the storage device is a th state, and checking whether at least one of th preset storage area, second preset storage area and third preset storage area is a power-down test area, and when the storage device is in a th state, power supply is recovered, the storage device is not restored, and whether the mapping relationship between the third preset storage area is found and whether the mapping relationship is not found.
Preferably, in embodiments of the present invention, before step A2, the method further comprises the step of setting signal pins on the memory device to be tested.
In the embodiments of the present invention, the status of the memory device is status when the level of the signal pin changes from high to low, and the th characteristic data, the second characteristic data and the third characteristic data are preferably different data representations, so that the th characteristic data, the second characteristic data and the third characteristic data can be exchanged with each other, or other different characteristic data can be used, as long as the difference between the three is ensured.
Preferably, in embodiments of the present invention, the State is a programming State (programming State), further to , and the State may also be a Sending-data State (Sending-data State) and a receiving-data State (receiving-data State), etc., depending on the data State of the memory to be tested and the corresponding power-down protection policy, without violating the spirit of the present invention.
, in embodiments of the present invention, the method provided by the present invention can perform corresponding power down according to different processing states of the storage device on the data, and further test a corresponding device power down protection policy according to a power down policy executed by the storage device.
, in embodiments of the present invention, the cutting off power to the storage device includes any of cutting off at a preset time, at a random time, or according to the memory data processing state.
, in the embodiments of the present invention, the th default storage area includes the second default storage area and the third default storage area, and the second default storage area and the third default storage area do not overlap.
Preferably, in embodiments of the present invention, the th preset storage area is the entire storage area of the memory to be tested, and the second preset storage area and the third storage area may be continuous or multiple discontinuous random areas, as long as it is ensured that the second preset storage area and the third preset storage area do not overlap, that is, there is no intersection between the two.
The main purpose of power down testing the storage device is to verify the capability of the storage device to process and protect data when abnormal power down occurs, so that data comparison and verification before and after power down are very important loops, when data verification is accurately performed, the data processing state of the storage device before power down can be determined, if PMU (power management unit) fails to power down when data is being written and PMU (power management unit) finishes writing, expected stored data during verification is completely different, conventional whole power down testing methods have the problem that accurate verification cannot be performed on data verification, the problem is solved by adding a data signal pin on a test board, the execution process of the test program is described by the power down of a Programming state (Programming state) during test write data, referring to a third embodiment of a power down testing method for testing the storage device of according to the invention shown in FIG. 3, after the test program runs, the test program first performs power down testing on the data by using a Programming state (Programming state) as a Programming state, the test program is described by using a data signal pin, when a test data is written, a test data is performed by using a test data signal pin, a test data is a data area, a data area is selected as a data area, a data area is a data area, a data area with a data area, a data area with a power down, a data area with a power down, a power test area with a power down, a power test area with a power test area, a power down, a power test area.
It should be understood that the above application Programming State (Programming State) is powered down to illustrate the execution process of the test program, and is not intended to limit the present invention, and as mentioned above, the power down test may also be performed for the Sending-data State (Sending-data State) and the receiving-data State (receiving-data State) of the memory.
, referring to a block diagram of an th embodiment of the power down testing apparatus for kinds of storage devices shown in fig. 4, the power down testing apparatus for a storage device applying the method according to embodiments of the present invention includes a storage device to be tested, a signal pin connected to the storage device to be tested and outputting at least signals indicating a state of the storage device to be tested, and a controller connected to the storage device to be tested and configured to write preset feature data to the storage device to be tested, control power supply to the storage device to be cut off and restored, and read data in the storage device to be tested, after power supply to the storage device is restored, find whether data different from the th feature data, the second feature data, and the third feature data exists in the storage device to be tested, and check whether a mapping relationship between data in the storage device to be tested and a storage area conforms to the preset relationship.
referring to architecture diagram of storage device power down test system according to the invention shown in fig. 6, there is shown storage device power down test system applying the method and including the storage device power down test apparatus according to embodiments of the invention, which includes a server storing therein a test program including the method, or more test nodes communicatively connected to the server and storing therein a test program including the method, or more storage devices to be tested connected to the test nodes and receiving and running the test program transmitted from the test nodes, wherein the test nodes are child nodes of the server, and the storage devices to be tested are child nodes of the test nodes, , before the test is started, transmitting to the server at least test parameters, and then transmitting to the server at least storage device parameters associated to the test and executing the test to be tested.
Referring to the schematic diagrams of the operation of the storage device power-down test system according to the present invention shown in fig. 7 in conjunction with the above-mentioned fig. 1 to 6, preferred workflows of the method, apparatus and system according to the present invention are described below:
1. on the test system, the deployment architecture is shown in fig. 6. The system consists of a server, a plurality of test nodes and a test board carrying storage equipment. And the tester remotely distributes the power-down test items to each test node through the server. The test nodes download the test programs to the test board and start the test programs, simultaneously monitor the test state in the test, and upload the test information to the server, thereby showing the test conditions to the testers in real time.
2. In the test program downloading mode, the system provides a wired and wireless downloading mode, can better adapt to the limitation of the test environment, and can quickly build a test. The wired downloading mode comprises but is not limited to a serial port and a USB, and the wireless downloading mode comprises but is not limited to WIFI and Bluetooth.
3. The power-down test method can be used for carrying out power-down according to the processing State of data of the storage device, the coverage surface is , a special signal pin is arranged in a used test board, the main structure of the test board is shown in fig. 5, when the storage device carries out data storage, the current data processing State of the storage device can be detected, such as a Sending data State (Sending-data State), a receiving data State (receiving-data State), a Programming State (Programming State) and the like, and the test program detects the State of the signal pin, and when the storage device is in the data processing State which accords with power-down triggering, the test program can control PMU (phasor measurement unit) output of the test board, so that the power-down of the storage device is realized.
4. In the aspect of power failure control, the test board can be set according to a test program, only part of power supplies of the storage equipment are cut off, if only storage IO or power supply of the controller is cut off, and the test is more accurate, sufficient and complete.
To better illustrate the technical solution and advantages of the present invention, the following will describe the content of the present invention by steps with reference to the drawings and specific embodiments, in the present invention, the complete power down test process can be shown in fig. 7, wherein:
1. and a tester logs in the test management system through the browser to perform power failure test configuration. The power failure test configuration comprises selection of test nodes and test prototypes, setting of test scenes, setting of power failure types and the like, wherein the power failure types comprise fixed time power failure, random time power failure, power failure according to data processing states and the like.
2. After the testing personnel finish the test configuration, the configuration parameters are submitted to the server. And after receiving the test request, the server distributes the task to the test node PC according to the test configuration.
3. After receiving the test task command, the test node first checks whether there is a corresponding test program locally. If not, synchronizing from the server to the local; if yes, the test program is downloaded to the test board and run. During downloading program, the test node will select to use wired download or wireless download according to the connection configuration between the test node and the test board.
4. After the program runs, data read-write operation is carried out on the storage device according to the appointed test scene, and whether the current processing state of the storage device on the data accords with the power failure test setting or not is monitored in real time. And if so, triggering a power down module to power down the storage equipment.
5. In the running process of the test program, current test information is returned to the test nodes, such as whether data reading and writing are normal, whether power failure starts or not, whether data verification starts or not, and the like, after the nodes forward the information to the server, the server analyzes and processes the data, and the data is returned to the browser and then displayed to a tester, and it needs to be noted that the whole test data display process is real-time processes.
Finally, in embodiments of the present invention, computer-readable storage media are proposed, on which a computer program is stored, characterized in that the computer program realizes the above-mentioned method steps when executed by a processor.
It should be recognized that embodiments of the present invention can be realized and implemented by computer hardware, a combination of hardware and software, or by computer instructions stored in a non-transitory computer readable memory. The methods may be implemented in a computer program using standard programming techniques, including a non-transitory computer-readable storage medium configured with the computer program, where the storage medium so configured causes a computer to operate in a specific and predefined manner, according to the methods and figures described in the detailed description. Each program may be implemented in a high level procedural or object oriented programming language to communicate with a computer system. However, the program(s) can be implemented in assembly or machine language, if desired. In any case, the language may be a compiled or interpreted language. Furthermore, the program can be run on a programmed application specific integrated circuit for this purpose.
Further , the method can be implemented in any type of computing platform operatively connected to the appropriate, including but not limited to a personal computer, mini computer, mainframe, workstation, network or distributed computing environment, separate or integrated computer platform, or in communication with a charged particle tool or other imaging device, etc. aspects of the invention can be implemented in machine readable code stored on a non-transitory storage medium or device, whether removable or integrated into a computing platform, such as a hard disk, optically read and/or write storage media, RAM, ROM, etc., such that it can be read by a programmable computer, which when read by a computer can be used to configure and operate the computer to perform the processes described herein.
Embodiments of this disclosure are described herein, including the best mode known to the inventors for carrying out the invention. Variations of those described embodiments may become apparent to those of ordinary skill in the art upon reading the foregoing description. The inventors expect skilled artisans to employ such variations as appropriate, and the inventors intend for the embodiments of the disclosure to be practiced otherwise than as specifically described herein. Accordingly, the scope of the present disclosure includes all modifications and equivalents of the subject matter recited in the claims appended hereto as permitted by applicable law. Moreover, the scope of the present disclosure encompasses any combination of the above-described elements in all possible variations thereof unless otherwise indicated herein or otherwise clearly contradicted by context.
While the present invention has been described in considerable detail and with reference to certain illustrated embodiments thereof, it is not intended to be limited to any such details or embodiments or any particular embodiment, but rather should be construed to effectively cover the intended scope of the invention by providing sense of the prior art with reference to the appended claims, which are intended to provide a useful description of the invention in its presently contemplated embodiments, and insubstantial modifications of the invention, not presently foreseen, may nonetheless represent equivalent modifications thereto.
It will, however, be evident that various modifications and changes may be made thereto without departing from the broader spirit and scope of of the present application as set forth in the claims.
It should be understood, however, that there is no intention to limit the application to the specific form or forms of disclosed, but on the contrary, the intention is to cover all modifications, alternative constructions, and equivalents falling within the spirit and scope of the application, as defined in the appended claims.
Claims (10)
1, storage device power failure test method, characterized by, including the following steps:
a1, writing two different preset characteristic data into at least two different preset storage areas of the storage device to be tested respectively;
b1, monitoring the data storage state of a storage device while writing characteristic data, cutting off power supply to the storage device when the storage state of the storage device is th state, and taking at least preset storage areas as power failure test areas;
and C1, after the power supply to the storage device is recovered, comparing the data stored in at least of at least two different preset storage areas with the preset characteristic data corresponding to the preset storage areas.
2, storage device power failure test method, characterized by, including the following steps:
a2, establishing a preset mapping relation between data of a storage device to be tested and a storage area, and writing characteristic data into a corresponding storage area in the storage device according to the preset mapping relation, wherein th characteristic data are written into a th preset storage area of the storage device, second characteristic data are written into a second preset storage area of the storage device, and third characteristic data are written into a third preset storage area of the storage device;
b2, monitoring the data storage state of a storage device while writing characteristic data, cutting off power supply to the storage device when the storage state of the storage device is th state, and taking at least of th preset storage area, second preset storage area and third preset storage area as power failure test areas;
and C2, after the power supply to the storage equipment is recovered, searching whether the data different from the th characteristic data, the second characteristic data and the third characteristic data exist in the storage equipment, and after the power supply is recovered, detecting whether the mapping relation between the data in the storage equipment to be tested and the storage area accords with the preset mapping relation.
3. The method for testing power failure of the storage device according to claim 2, wherein before step a2, the method further comprises the following steps:
and setting a signal pin on the storage device to be tested.
4. The method for power down testing of a memory device according to claim 3, wherein when the level of the signal pin changes from high to low, the state of the memory device is th state.
5. The method for power down testing of the storage device according to claim 2, wherein the cutting off of power supply to the storage device comprises any of cutting off at a preset time, cutting off at a random time, or cutting off according to the data processing state of the storage device.
6. The method for testing power failure of the storage device of any of claims 2-5, wherein the th default storage area includes the second default storage area and the third default storage area, and wherein the second default storage area is not overlapped with the third default storage area.
7, a power down test apparatus for a memory device using the method of claims 1- , comprising:
a storage device to be tested;
a signal pin connected to the memory device to be tested and outputting at least signals indicating a status of the memory device to be tested;
the controller is connected with the storage equipment to be tested and is used for at least writing preset characteristic data into the storage equipment to be tested, controlling the power supply of the storage equipment to be cut off and restored, reading out data in the storage equipment to be tested, searching whether data different from the th characteristic data, the second characteristic data and the third characteristic data exist in the storage equipment after the power supply of the storage equipment is restored, and detecting whether the mapping relation between the data in the storage equipment to be tested and a storage area accords with the preset mapping relation after the power supply is restored.
8, storage device power down test system using the method of of claims 1 to 6 and including the storage device power down test apparatus of claim 7, comprising:
a server having stored therein a test program comprising the method of of claims 1-6;
one or more test nodes communicatively connected to the server, the test nodes having stored therein a test program comprising the method of claims 1-6 ;
one or more storage devices under test, the storage devices connected to the test node, receiving and running test programs transmitted from the test node;
wherein the test node is a child node of the server; and the storage device to be tested is a child node of the test node.
9. The system for power down testing of storage devices of claim 8, wherein before testing begins, after transmitting at least test parameters to the server, transmitting the test degrees associated with the at least test parameters to the storage device to be tested and executing.
Computer-readable storage medium, 10, , having stored thereon a computer program, characterized in that the computer program, when being executed by a processor, is adapted to carry out the steps of the method according to of claims 1 to 6.
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| CN112133357A (en) * | 2020-09-30 | 2020-12-25 | 深圳市宏旺微电子有限公司 | eMMC testing method and device |
| CN113960391A (en) * | 2021-09-13 | 2022-01-21 | 珠海亿智电子科技有限公司 | Abnormal power failure testing device and method for storage medium |
| CN118409921A (en) * | 2024-07-02 | 2024-07-30 | 合肥康芯威存储技术有限公司 | Storage test unit, test method thereof and electronic equipment |
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