CN107843772A - Sensitivity multiplication vacuum gauge pipe group - Google Patents

Sensitivity multiplication vacuum gauge pipe group Download PDF

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Publication number
CN107843772A
CN107843772A CN201610832495.3A CN201610832495A CN107843772A CN 107843772 A CN107843772 A CN 107843772A CN 201610832495 A CN201610832495 A CN 201610832495A CN 107843772 A CN107843772 A CN 107843772A
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CN
China
Prior art keywords
vacuum
vacuum gauge
thin film
capacitor thin
capacitor
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Pending
Application number
CN201610832495.3A
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Chinese (zh)
Inventor
黄洛俊
景玉鹏
康恒
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Institute of Microelectronics of CAS
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Institute of Microelectronics of CAS
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Publication date
Application filed by Institute of Microelectronics of CAS filed Critical Institute of Microelectronics of CAS
Priority to CN201610832495.3A priority Critical patent/CN107843772A/en
Publication of CN107843772A publication Critical patent/CN107843772A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605Measuring capacitance

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Fluid Pressure (AREA)

Abstract

The invention provides a sensitivity multiplication vacuum gauge group, and relates to the technical field of semiconductors.

Description

A kind of sensitivity enhancement vacuum gauge group
Technical field
The present invention relates to technical field of semiconductors, more particularly to a kind of sensitivity enhancement vacuum gauge group.
Background technology
With the continuous progress of science and technology, many high-tech sectors need high vacuum environment.Especially in semiconductor The many processing steps of manufacturing field need to carry out under condition of high vacuum degree, for example etch, the technique such as deposition.
In above-mentioned semiconductor manufacturing, the measurement for vacuum is often achieved by the way of vacuum gauge, such as The measuring principle of capacitor thin film vacuum gauge is that gas is incorporated into measuring chamber by air inlet pipe, because gas pressure effect makes electric capacity Film deforms upon, and causes the change of distance between capacitor thin film and fixed polar plate, and then causes capacitance therebetween Change, recycle electrical method to measure capacitance, it is true to weigh to obtain the relation between capacitance and gas pressure by calibration The size of reciprocal of duty cycle.
But those skilled in the art have found in practice process:
Vacuum gauge of the prior art Shortcomings in sensitivity, stability.
The content of the invention
In view of the above problems, it is proposed that the present invention so as to provide one kind overcome above mentioned problem or at least in part solve on State a kind of sensitivity enhancement vacuum gauge group of problem.
In order to solve the above problems, the application provides a kind of sensitivity enhancement vacuum gauge group, and the vacuum gauge group is extremely Including two vacuum gauges less, at least two vacuum gauge is set by the way of in parallel, wherein, the vacuum gauge bag Include:One housing, the housing is interior to have an accommodation space;One capacitor thin film, the capacitor thin film are arranged at the accommodation space It is interior, and the accommodation space is divided into detected space and vacuum space;One air inlet, the air inlet are arranged at the housing On, and the detected space is connected by the air inlet with air inlet pipe;One fixed plate electrode, the fixed plate electrode are arranged at In the vacuum space;One electrode, the electrode are arranged on the housing, and are connected with the fixed plate electrode;Wherein, institute State capacitor thin film and the fixed plate electrode forms differential capacitor.
Preferably, the vacuum gauge also includes:One getter, it is arranged on the housing.
Preferably, the vacuum space is vacuum room.
Preferably, the capacitor thin film is Inconel X750 alloy capacitor thin films.
Preferably, the capacitor thin film is Inconel X750 Langaloy capacitor thin films.
Preferably, the capacitor thin film thickness is 10-50um.
Preferably, the capacitor thin film diameter 30-110mm.
The application has the beneficial effect that:
A kind of sensitivity enhancement vacuum gauge group that the application provides employs at least two vacuum gauges and is connected in parallel, The size of capacitor thin film in whole measurement implementation process is effectively raised, improves the measurement sensitivity of whole vacuum.
Described above is only the general introduction of technical solution of the present invention, in order to better understand the technological means of the present invention, And can be practiced according to the content of specification, and in order to allow above and other objects of the present invention, feature and advantage can Become apparent, below especially exemplified by the embodiment of the present invention.
Brief description of the drawings
By reading the detailed description of hereafter preferred embodiment, it is various other the advantages of and benefit it is common for this area Technical staff will be clear understanding.Accompanying drawing is only used for showing the purpose of preferred embodiment, and is not considered as to the present invention Limitation.And in whole accompanying drawing, identical part is denoted by the same reference numerals.In the accompanying drawings:
Fig. 1 shows the structural representation of single vacuum gauge according to an embodiment of the invention;
Fig. 2 shows the instrumentation plan according to another two vacuum gauge of embodiment of the invention.
Embodiment
The exemplary embodiment of the disclosure is more fully described below with reference to accompanying drawings.Although the disclosure is shown in accompanying drawing Exemplary embodiment, it being understood, however, that may be realized in various forms the disclosure without should be by embodiments set forth here Limited.On the contrary, these embodiments are provided to facilitate a more thoroughly understanding of the present invention, and can be by the scope of the present disclosure Completely it is communicated to those skilled in the art.
The embodiments of the invention provide a kind of sensitivity enhancement vacuum gauge group to employ the parallel connection of at least two vacuum gauges Together, the size of capacitor thin film in whole measurement implementation process is effectively raised, improves the measurement spirit of whole vacuum Sensitivity.
Specifically, the sensitive of capacitor thin film vacuum gauge is improved, it is necessary to calculation formula according to parallel plate capacitor size:To be designed, wherein ε represents dielectric constant, and S represents the area of fixed plate electrode, and d is two fixed electricity The distance between pole plate and capacitor thin film, R are the radiuses of capacitor thin film.Simultaneously according to electric capacity parallel connection formula C=C1+C2, two Capacitor thin film vacuum gauge is connected in parallel, and the whole electric capacity that measures can also increase.In practical operation, change the size of capacitor thin film (size for changing S either d) or some are made in capacitance connection structure change (such as parallel connection of multiple electric capacity vacuum gauges) To change the size of electric capacity, it is possible to strengthen the sensitivity of capacitor thin film vacuum gauge, electric capacity is bigger, and circuit measuring relative accuracy is just It is higher.So for the embodiment of the present application, it is connected in parallel by two or even multiple vacuum gauges, you can with effective The size of the capacitor thin film in whole measurement implementation process is improved, and then improves the sensitivity entirely measured.Further, lead to The vacuum gauge for crossing multiple general sensitivity is connected in parallel, and the electric capacity that can effectively improve in whole measurement implementation process is thin The size of film, also there is the effect for improving whole vacuum measurement precision.Specifically, for the volume cost in parallel of vacuum gauge Application embodiment is not particularly limited, and can specifically be determined according to the needs of measurement accuracy and the feasibility of circuit analysis The number of vacuum gauge.
Specifically, as shown in Figure 1, 2, the application provides a kind of sensitivity enhancement vacuum gauge group, the vacuum gauge Group comprises at least two vacuum gauges, and at least two vacuum gauge is set by the way of in parallel, wherein, the vacuum gauge Pipe includes:
One housing 1, the housing 1 is interior to have an accommodation space;
One capacitor thin film 3, the capacitor thin film 3 are arranged in the accommodation space, and the accommodation space be divided into by Survey space 21 and vacuum space 22;
One air inlet 4, the air inlet 4 is arranged on the housing 1, and the detected space 21 passes through the air inlet 4 connect with air inlet pipe 5;
One fixed plate electrode 6, the fixed plate electrode 6 are arranged in the vacuum space 22;
One electrode 7, the electrode 7 are arranged on the housing 1, and are connected with the fixed plate electrode 6;
Wherein, the capacitor thin film 3 and the fixed plate electrode 6 form differential capacitor.
From the above as can be seen that fixed plate electrode 6 and float electrode film 3 constitute differential capacitor, and as survey Measure two movable bridge arms of the electric bridge of circuit 9, when movable capacitor thin film 3 is in home position, capacitive differential zero.When tested For gas after the entrance of air inlet pipe 5, the air pressure at air inlet in 4 detected space 21 can form gas with the air pressure in vacuum space 22 Pressure difference, the draught head on both sides cause capacitor thin film 3 to deform upon, and it is no longer zero to cause capacitive differential, now the uneven meeting of electric bridge Produce electric signal.Above-said current signal can be obtained by the actual signal that can be weighed after being put into and detection is handled.
For the application, after two or even multiple vacuum gauge parallel connections, each thin-film capacitor can deform upon, production Raw electric signal obtains higher sensitivity after the Balance Treatment of measuring circuit.Specifically, by above-mentioned multiple capacitor thin films Parallel connection deforms upon, and is then electric signal the reacting condition of electric capacity, then is finally obtained by the analysis of electric signal final true Reciprocal of duty cycle result, it is however generally that, the vacuum result has higher sensitivity and measurement essence than the analysis of single vacuum gauge electric signal Degree.It is such as higher than single precision about one times with two vacuum gauge parallel connections, actual measured results.
Specifically, capacitor thin film described above can use Inconel X750 alloy capacitor thin films, and the alloy is not only With good corrosion-resistant and oxidation resistant performance, also with good formability and welding performance.In further, the electricity Inconel X750 Langaloy capacitor thin films can also be used by holding film.
In the size selection of the capacitor thin film, it is however generally that need to consider the whole area of the thickness of film and film Relation, it is however generally that, the thickness of electric capacity is in 10-50um, diameter 30-110mm.
For a specific embodiment, obtained by the method for experiment:It is thin using Inconel X750 alloy electric capacity Film, its thickness is 30um, a diameter of 50mm, and is tested by the way of two vacuum gauges are in parallel, and the data of acquisition are: Sensitivity of the measurement sensitivity than single capacitor thin film vacuum gauge improves 80 about percent.
Further, the vacuum gauge group also includes getter 8, is arranged on the housing 1, wherein, getter 8 is used Air in vacuum space 22, make the vacuum room in vacuum space, and then lift the accuracy and sensitivity entirely measured.
The embodiment of the present application has the beneficial effect that:
A kind of sensitivity enhancement vacuum gauge group that the embodiment of the present application provides employs the parallel connection of at least two vacuum gauges Together, the size of capacitor thin film in whole measurement implementation process is effectively raised, improves the measurement spirit of whole vacuum Sensitivity.
Further, the embodiment of the present application is connected in parallel by the vacuum gauge of multiple general sensitivity, can be effective The whole measurement implementation process of raising in capacitor thin film size, also there is the effect for improving whole vacuum measurement precision.
Further, in the embodiment of the present application, capacitor thin film can use Inconel X750 alloy capacitor thin films, the conjunction Gold not only has good corrosion-resistant and oxidation resistant performance, also with good formability and welding performance
Further, the embodiment of the present application is by using Inconel X750 alloy capacitor thin films, and its thickness is 30um, directly Footpath is 50mm, and is tested by the way of two vacuum gauges are in parallel, and the data of acquisition are:Measurement sensitivity is than single electricity Hold the sensitivity that film vacuum is regulated and improve 80 about percent.
Further, the air that the embodiment of the present application is used in vacuum space 22 by getter 8, makes in vacuum space Vacuum room, and then lift the accuracy and sensitivity entirely measured.
It should be noted last that above embodiment is merely illustrative of the technical solution of the present invention and unrestricted, Although the present invention is described in detail with reference to example, it will be understood by those within the art that, can be to the present invention Technical scheme modify or equivalent substitution, without departing from the spirit and scope of technical solution of the present invention, it all should cover Among scope of the presently claimed invention.

Claims (7)

  1. A kind of 1. sensitivity enhancement vacuum gauge group, it is characterised in that:The vacuum gauge group comprises at least two vacuum gauges, At least two vacuum gauge is set by the way of in parallel, wherein, the vacuum gauge includes:
    One housing, the housing is interior to have an accommodation space;
    One capacitor thin film, the capacitor thin film are arranged in the accommodation space, and the accommodation space is divided into detected space And vacuum space;
    One air inlet, the air inlet are arranged on the housing, and the detected space passes through the air inlet and air inlet pipe Connection;
    One fixed plate electrode, the fixed plate electrode are arranged in the vacuum space;
    One electrode, the electrode are arranged on the housing, and are connected with the fixed plate electrode;
    Wherein, the capacitor thin film and the fixed plate electrode form differential capacitor.
  2. 2. vacuum gauge group as claimed in claim 1, it is characterised in that the vacuum gauge also includes:
    One getter, it is arranged on the housing.
  3. 3. vacuum gauge group as claimed in claim 2, it is characterised in that the vacuum space is vacuum room.
  4. 4. vacuum gauge group as claimed in claim 1, it is characterised in that the capacitor thin film is InconelX750 alloys electricity Hold film.
  5. 5. vacuum gauge group as claimed in claim 4, it is characterised in that the capacitor thin film is the nickelic conjunctions of InconelX750 Gold capacitor film.
  6. 6. vacuum gauge group as claimed in claim 1, it is characterised in that the capacitor thin film thickness is 10-50um.
  7. 7. vacuum gauge group as claimed in claim 1, it is characterised in that the capacitor thin film diameter 30-110mm.
CN201610832495.3A 2016-09-19 2016-09-19 Sensitivity multiplication vacuum gauge pipe group Pending CN107843772A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610832495.3A CN107843772A (en) 2016-09-19 2016-09-19 Sensitivity multiplication vacuum gauge pipe group

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610832495.3A CN107843772A (en) 2016-09-19 2016-09-19 Sensitivity multiplication vacuum gauge pipe group

Publications (1)

Publication Number Publication Date
CN107843772A true CN107843772A (en) 2018-03-27

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Country Status (1)

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CN (1) CN107843772A (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2136465Y (en) * 1992-10-21 1993-06-16 清华大学 Capacitive membrane pressure transducer with sputtering electrode
CN2288431Y (en) * 1996-09-28 1998-08-19 上海无线电二十三厂 Capacitive baroceptor
CN1225494A (en) * 1998-02-04 1999-08-11 胡耿 Shape-changeable and resilience film capacitor having additional electrode plate
CN1283267A (en) * 1997-12-23 2001-02-07 尤纳克西斯巴尔策斯有限公司 Capacitive vacuum measuring cell
CN1334451A (en) * 2000-07-15 2002-02-06 山东省硅酸盐研究设计院 Ceramic pressure sensor and differential pressure sensor
US20090158853A1 (en) * 2007-12-20 2009-06-25 Walter Christian Berner Diaphragm pressure measuring cell arrangement
CN101776502A (en) * 2008-12-24 2010-07-14 佳能安内华股份有限公司 Capacitance diaphragm gauge and vaccum apparatus
CN105044390A (en) * 2014-04-16 2015-11-11 富士电机株式会社 Sensitivity inspection system and sensitivity inspection method

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2136465Y (en) * 1992-10-21 1993-06-16 清华大学 Capacitive membrane pressure transducer with sputtering electrode
CN2288431Y (en) * 1996-09-28 1998-08-19 上海无线电二十三厂 Capacitive baroceptor
CN1283267A (en) * 1997-12-23 2001-02-07 尤纳克西斯巴尔策斯有限公司 Capacitive vacuum measuring cell
CN1225494A (en) * 1998-02-04 1999-08-11 胡耿 Shape-changeable and resilience film capacitor having additional electrode plate
CN1334451A (en) * 2000-07-15 2002-02-06 山东省硅酸盐研究设计院 Ceramic pressure sensor and differential pressure sensor
US20090158853A1 (en) * 2007-12-20 2009-06-25 Walter Christian Berner Diaphragm pressure measuring cell arrangement
CN101776502A (en) * 2008-12-24 2010-07-14 佳能安内华股份有限公司 Capacitance diaphragm gauge and vaccum apparatus
CN105044390A (en) * 2014-04-16 2015-11-11 富士电机株式会社 Sensitivity inspection system and sensitivity inspection method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
孙雯君 等: "小型电容薄膜真空规的设计", 《真空与低温》 *

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Application publication date: 20180327