CN106872829A - The test system of multifrequency integrated power amplifier - Google Patents
The test system of multifrequency integrated power amplifier Download PDFInfo
- Publication number
- CN106872829A CN106872829A CN201710157314.6A CN201710157314A CN106872829A CN 106872829 A CN106872829 A CN 106872829A CN 201710157314 A CN201710157314 A CN 201710157314A CN 106872829 A CN106872829 A CN 106872829A
- Authority
- CN
- China
- Prior art keywords
- power amplifier
- signal
- test
- integrated power
- multifrequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Amplifiers (AREA)
Abstract
The present invention relates to a kind of test system of multifrequency integrated power amplifier, including signal generation apparatus, channel switching device and testing service device；The testing service device connects the control end and the signal generation apparatus of the channel switching device respectively；The signal input part of the channel switching device connects the signal generation apparatus, and the channel switching device is provided with multiple signal output parts；Testing service device reads the test target data of the multifrequency integrated power amplifier, the corresponding test cases of multifrequency integrated power amplifier according to the test target data genaration, the read module testing scheme from the test cases, controls the channel switching device to connect module testing scheme corresponding TCH test channel in multifrequency integrated power amplifier according to the module testing scheme；The signal generation apparatus are driven to send rf excitation signal；And receive the live signal that the multifrequency integrated power amplifier receives feedback after the rf excitation signal.
Description
Technical field
The present invention relates to communication technical field, more particularly to a kind of test system of multifrequency integrated power amplifier.
Background technology
With developing rapidly for mobile communication technology, mobile communications network scale and capacity constantly expand, number of mobile users
Amount development is surprising.But the complexity of and wireless communications environment difficult due to communication base station addressing, the communications status of people are frequent
Restricted by range of signal and signal quality, therefore improved signal covering, lifted user perceptibility, had become urgently to be resolved hurrily
Problem, and power amplifier, used as information transfer and the key link of signal transacting, its research level is directly affected and communicated
The performance of system.Multifrequency integrated power amplifier is compared with traditional power amplifier, and built-in monitoring system and simulation are pre-
Distortion function, supports multiband multi-standard, with small volume, novel in structural design, integrated functionality be stronger, the linearity is preferably special
Point.Multifrequency integrated power amplifier includes multiple power amplifier modules, and inside structure is extremely complex, thus for multifrequency integration work(
The difficulty that each power amplifier module is tested in rate amplifier increases.
In traditional scheme, it is necessary to obtain multifrequency integration respectively when being tested for multifrequency integrated power amplifier
The corresponding test cases of each power amplifier module of power amplifier, different test equipments pair are utilized respectively according to above-mentioned test cases
Each frequency channel is tested accordingly, and test process is complicated.
The content of the invention
Based on this, it is necessary to for traditional scheme for the complicated technology of the test process of multifrequency integrated power amplifier
A kind of problem, there is provided test system of multifrequency integrated power amplifier.
A kind of test system of multifrequency integrated power amplifier, including signal generation apparatus, channel switching device and
Testing service device；
The testing service device connects the control end and the signal generation apparatus of the channel switching device respectively；Institute
The signal input part for stating channel switching device connects the signal generation apparatus, and it is defeated that the channel switching device is provided with multiple signals
Go out end, each signal output part is respectively used to transmit the test signal of special frequency channel；
The testing service device reads the test target data of the multifrequency integrated power amplifier, according to the test
Target data generates the corresponding test cases of the multifrequency integrated power amplifier, and read module is surveyed from the test cases
Examination scheme, controls the channel switching device to connect the module testing scheme in multifrequency integrally according to the module testing scheme
Change corresponding TCH test channel in power amplifier；The signal generation apparatus are driven to send rf excitation signal；And receive institute
State multifrequency integrated power amplifier and receive the live signal fed back after the initial signal；
The signal generation apparatus send rf excitation signal under the driving of testing service device；
It is defeated that the channel switching device connects the corresponding signal of the module testing scheme under the control of testing service device
The communication link gone out between the TCH test channel corresponding with module testing scheme in multifrequency integrated power amplifier of end.
In the test system of above-mentioned multifrequency integrated power amplifier, testing service device can be according to multifrequency integration power
The test target data genaration of amplifier includes needing the power amplifier module institute for being tested right in multifrequency integrated power amplifier
The test cases of the module testing scheme answered, the module testing scheme in above-mentioned test cases connects multifrequency integration power
Corresponding TCH test channel in amplifier, then drive the signal generation apparatus to send rf excitation signal to corresponding power amplifier module
Tested, it can realize the test to each power amplifier module of multifrequency integrated power amplifier, be effectively simplified for many
The test process of frequency integrated power amplifier, improves corresponding testing efficiency.
Brief description of the drawings
Fig. 1 is the test system structure schematic diagram of the multifrequency integrated power amplifier of one embodiment；
Fig. 2 is the test system structure schematic diagram of the multifrequency integrated power amplifier of one embodiment；
Fig. 3 is the test system structure schematic diagram of the multifrequency integrated power amplifier of one embodiment.
Specific embodiment
The specific embodiment party of the test system of the multifrequency integrated power amplifier for providing the present invention below in conjunction with the accompanying drawings
Formula is described in detail.
With reference to Fig. 1, the test system structure that Fig. 1 show the multifrequency integrated power amplifier of one embodiment is illustrated
Figure, including signal generation apparatus 10, channel switching device 21 and testing service device 41；
The control end and the signal that the testing service device 41 connects the channel switching device 21 respectively are filled
Put 10；The signal input part of the channel switching device 21 connects the signal generation apparatus 10, the channel switching device 21
Multiple signal output parts are provided with, each signal output part is respectively used to transmit the test signal of special frequency channel；In actual applications,
The signal output part of above-mentioned channel switching device 21 can be with the test of each power amplifier module of multifrequency integrated power amplifier 51
Passage correspondence is connected, i.e., one signal output part connects a TCH test channel, and above-mentioned signal output part is used for power amplifier module pair
The TCH test channel that the test signal answered is connected through is transmitted to above-mentioned power amplifier module.Above-mentioned multifrequency integrated power amplifier 51
Including signal output part, the signal output part of above-mentioned multifrequency integrated power amplifier 51 can be directly connected to testing service device
41, it is also possible to by certain communication port connecting test server 41 of channel switching device 21, so as to multifrequency integration power
The power amplifier module of amplifier 51 is fed back in real time by above-mentioned signal output part after test signal is received to testing service device 41
Signal, corresponding test result is obtained for testing service device 41；
The testing service device 41 reads the test target data of the multifrequency integrated power amplifier 51, according to described
The corresponding test cases of multifrequency integrated power amplifier 51 described in test target data genaration, reads from the test cases
Module testing scheme, controls the channel switching device 21 to connect the module testing scheme and exists according to the module testing scheme
Corresponding TCH test channel in multifrequency integrated power amplifier 51；Drive the signal generation apparatus 10 to send RF excited to believe
Number；And receive the live signal that the multifrequency integrated power amplifier 51 receives feedback after the rf excitation signal；
The signal generation apparatus 10 send rf excitation signal under the driving of testing service device 41；Specifically, it is above-mentioned
Testing service device 41 can control above-mentioned signal generation apparatus 10 to send the corresponding power amplifier of test according to specific module testing scheme
Rf excitation signal needed for module, to ensure the accuracy that the above-mentioned rf excitation signal of later use is tested；
The channel switching device 21 connects the corresponding letter of the module testing scheme under the control of testing service device 41
Communication link between number output end TCH test channel corresponding with module testing scheme in multifrequency integrated power amplifier 51, with
Just the TCH test channel that the rf excitation signal that above-mentioned signal generation apparatus 10 send is connected by channel switching device 21 be input into
Corresponding power amplifier module, the rf excitation signal back testing server 41 for making power amplifier module receive test feeds back letter in real time
Number.
In the test system of the multifrequency integrated power amplifier that the present embodiment is provided, testing service device 41 can be according to more
The test target data genaration of frequency integrated power amplifier 51 includes needing to be surveyed in multifrequency integrated power amplifier 51
The test cases of the module testing scheme corresponding to the power amplifier module of examination, the module testing scheme in above-mentioned test cases connects
Corresponding TCH test channel in logical multifrequency integrated power amplifier 51, then drive the signal generation apparatus to send RF excited letter
Number corresponding power amplifier module is tested, it can realize the survey to each power amplifier module of multifrequency integrated power amplifier 51
Examination, is effectively simplified the test process for multifrequency integrated power amplifier, improves corresponding testing efficiency.
In one embodiment, above-mentioned testing service device can read the test mesh of the multifrequency integrated power amplifier
Mark data, generate multifrequency integrated power amplifier each power amplifier module to be measured right respectively respectively according to the test target data
The module testing scheme answered, according to the test cases of the module testing schemes generation multifrequency integrated power amplifier.
Above-mentioned testing service device can also connect the associated communication port of multifrequency integrated power amplifier, by above-mentioned logical
Letter port obtains the test target data and related power amplifier configuration parameter of multifrequency integrated power amplifier；Testing service device
The acquisition of above-mentioned data can be carried out by reading the test target data and related power amplifier configuration parameter of user input.It is above-mentioned
Test target data include the index tested required for each power amplifier module to be measured in multifrequency integrated power amplifier, survey
Examination target data can include the relation data between each power amplifier module index to be measured corresponding with power amplifier module to be measured, such as
Above-mentioned test target data can include：The index to be measured of the first power amplifier module：Index A, index B, the second power amplifier module are treated
Survey index：Index A, index B, index C etc..
Testing service device is obtaining the related power amplifier configuration of above-mentioned test target data and multifrequency integrated power amplifier
After parameter, can be according to each power amplifier module difference to be measured in above-mentioned test target data genaration multifrequency integrated power amplifier
Corresponding module testing scheme, the test case of multifrequency integrated power amplifier is determined further according to above-mentioned multiple module testing schemes
Example, so that identified test cases includes the corresponding module testing scheme of each power amplifier module to be measured.
Used as one embodiment, above-mentioned testing service device can recognize the i-th power amplifier module correspondence from the test cases
The i-th module testing scheme, control the channel switching device to connect the i-th TCH test channel of multifrequency integrated power amplifier,
Rf excitation signal is sent according to the i-th module testing scheme driving signal generator, the multifrequency integration work(is received
I-th channel test signal of rate amplifier feedback；I is updated to i+1, the operation of the i-th module testing scheme of identification is repeated,
Until receiving the corresponding live signal of described each TCH test channel of multifrequency integrated power amplifier；Wherein, the initial value of i is
1, i maximum is N, and N is power amplifier module sum to be measured in multifrequency integrated power amplifier.
The present embodiment can be successively to multifrequency integrated power amplifier each power amplifier module to be measured surveyed accordingly
Examination, when obtaining each power amplifier module to be measured of test, live signal (each lane testing of multifrequency integrated power amplifier feedback
Signal), so that testing service device can obtain the test signal fed back after the test of each power amplifier module, the corresponding test knot of generation
Really, it is ensured that the integrality of the test result for being generated.
Used as one embodiment, above-mentioned testing service device detects whether to have received multifrequency integrated power amplifier each work(
The corresponding live signal of amplification module, if so, then sending initialization directive to signal generation apparatus and channel switching device respectively；Letter
Number generating means and channel switching device carry out initialization process according to the initialization directive respectively.
In the present embodiment, the detection of testing service device is receiving multifrequency integrated power amplifier each power amplifier module correspondence
Live signal, it is ensured that after more complete test result can be obtained, initialization directive to signal generation apparatus can be sent
And channel switching device, power-off control can also be carried out to above-mentioned signal generation apparatus and channel switching device, so as to above-mentioned letter
After number generating means and channel switching device carry out initialization process, carry out follow-up related work, this time test work can be reduced
Oppose the influence of its follow-up work.
Used as one embodiment, the i-th of the above-mentioned testing service device reception multifrequency integrated power amplifier feedback leads to
Road test signal, can detect whether i-th channel test signal includes anomaly parameter, if so, then output abnormality prompting letter
Number.
Above-mentioned anomaly parameter can include power anomaly parameter (the such as larger than setting power term of reference of corresponding power amplifier module
Performance number) etc. show corresponding live signal may to testing service device and multifrequency integrated power amplifier cause damage property
Can parameter, server when above-mentioned anomaly parameter is detected, it is necessary to output abnormality cue, so that relevant staff can be with
The abnormal information in test process is obtained in time, respective handling is carried out, it is to avoid testing service device and multifrequency integration power amplification
Corresponding damage in device, it is ensured that the security in test process there is.
Used as one embodiment, above-mentioned testing service device recognizes described each power amplifier module of multifrequency integrated power amplifier
Corresponding live signal, recognizes the signal characteristic parameter of each live signal respectively, is generated according to the signal characteristic parameter many
The test report of frequency integrated power amplifier.
Specifically, above-mentioned testing service device can be by judging whether a certain signal characteristic parameter is up to standard or exceeded determines
Whether corresponding test index is qualified, it is also possible to by judging whether a certain signal characteristic parameter belongs to certain setting range come really
Security performance of fixed corresponding test index etc., show that each signal characteristic parameter distinguishes corresponding test result with this, will be upper
State the corresponding test index of signal characteristic parameter, test result and produce the functional module correspondence of above-mentioned signal characteristic parameter to remember
Record, the test report of multifrequency integrated power amplifier is generated according to recorded data, to ensure that testing service device is generated
Test report order and integrality.
The test report that the present embodiment is generated includes the corresponding test result of each power amplifier module, with higher complete
Property, each power amplifier module is corresponding from above-mentioned test report acquisition multifrequency integrated power amplifier to allow relevant staff
Test information, is effectively simplified staff and obtains the process that multifrequency integrated power amplifier tests information.
In one embodiment, with reference to shown in Fig. 2, the test system of above-mentioned multifrequency integrated power amplifier can be with
Including frequency spectrograph 42, the input of the frequency spectrograph 42 connects the signal output part of the multifrequency integrated power amplifier 51,
The output end of the frequency spectrograph 42 connects the testing service device 41, and the frequency spectrograph 42 is used for multifrequency integration power
The live signal of the output of amplifier 51 carries out frequency-domain analysis, and the result that frequency-domain analysis is obtained is exported to testing service device
41。
The input of above-mentioned frequency spectrograph 42 can connect multifrequency integrally by certain communication port of channel switching device 21
Change the signal output part (as shown in Figure 2) of power amplifier 51；The input of frequency spectrograph 42 can also be directly connected to multifrequency integrally
Change the signal output part (not shown) of power amplifier 51.The live signal that multifrequency integrated power amplifier 51 is fed back
Input carries out frequency-domain analysis to above-mentioned live signal to frequency spectrograph 42 using above-mentioned frequency spectrograph 42, obtains above-mentioned live signal
The signal characteristic parameters such as the linearity, acquired signal characteristic parameter is sent to testing service device 41, can further be improved
The integrality of the test report that testing service device 41 is generated.
Used as one embodiment, the test system of above-mentioned multifrequency integrated power amplifier can also include attenuator 43,
The attenuator 43 is connected between the multifrequency integrated power amplifier 51 and frequency spectrograph 42, and it is right that the attenuator 43 is used for
The live signal of input spectrum instrument 42 carries out attenuation processing.
Above-mentioned attenuator 43 can be connected to the signal output part and frequency spectrograph of the multifrequency integrated power amplifier 51
Between 42, as shown in Fig. 2 attenuator 43 specifically can connect multifrequency integrated power amplifier 51 by channel switching device 21
Signal output part, after the live signal of the output end of multifrequency integrated power amplifier 51 is carried out into attenuation processing, then will be above-mentioned
Live signal is exported to frequency spectrograph 42, to ensure security when frequency spectrograph 42 carries out corresponding spectrum analysis.
With reference to shown in Fig. 3, in one embodiment, the test system of above-mentioned multifrequency integrated power amplifier can be with
Including power meter 44 and coupler 45；The input of the coupler 45 connects the output end of the attenuator 43, the coupling
The output end of device 45 connects the input of the frequency spectrograph 42, and the coupled end of the coupler 45 is connected by the power meter 44
The testing service device 41；
The coupling from the live signal for passing through of the coupler 45 obtains test signal component, by the test signal component
Output is to power meter 44, and the power meter 44 measures the power parameter of the test signal component, and the power parameter is defeated
Go out to testing service device 41.
The present embodiment can utilize power meter 44 to measure the power parameter of corresponding test signal component, measured power ginseng
Number has accuracy higher；Above-mentioned power parameter is sent to testing service device 41, corresponding test knot can be further improved
The integrality of fruit.
In one embodiment, with reference to shown in Fig. 3, above-mentioned signal generation apparatus 10 can include the first signal source 11, the
Binary signal source 12 and combiner 13；The control end of first signal source 11 and the control end in secondary signal source 11 connect survey respectively
Examination server 41；The output end in the output end for stating the first signal source 11 and secondary signal source 12 passes through the combiner respectively
The signal input part of the 13 connection channel switching devices 21；
First signal source 11 produces the first test signal to send to the combiner 13；Produce in the secondary signal source 12
Raw second test signal is sent to the combiner 13, and the combiner 13 is by first test signal and the second test signal
Treatment is combined, intermodulation signal is obtained and is sent the TCH test channel connected to the channel switching device 21.
Above-mentioned first signal source 11 can be produced needed for the corresponding power amplifier module of test under the control of testing service device 41
First test signal, secondary signal source 12 produces second needed for testing corresponding power amplifier module under the control of testing service device 41
Test signal, makes above-mentioned first test signal and the second test signal obtain intermodulation signal by the treatment of combiner 13, utilizes
Above-mentioned intermodulation signal carries out the test of corresponding power amplifier module, to improve test effect.
In one embodiment, above-mentioned testing service device can be the Intelligent treatments with data processing function such as computer
Equipment.Testing service device can set communication interaction unit, data processing unit, case generation unit and instrument driving unit
Deng the functional unit for testing multifrequency integrated power amplifier.Testing service device can be generated many using case generation unit
The corresponding test cases of frequency integrated power amplifier；It is (such as wherein each by instrument driving unit drive signals generating means
Individual signal source) send the rf excitation signal of test；Multifrequency integration power amplification is received by above-mentioned communication interaction unit
The corresponding function module receives the live signal fed back after rf excitation signal in device, and above-mentioned live signal is sent to data processing
Unit, the signal characteristic parameter of live signal is obtained using above-mentioned data processing unit, so that testing service device obtains corresponding
Test result, generates the test report of multifrequency integrated power amplifier.
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
Apply all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, the scope of this specification record is all considered to be.
Embodiment described above only expresses several embodiments of the invention, and its description is more specific and detailed, but simultaneously
Can not therefore be construed as limiting the scope of the patent.It should be pointed out that coming for one of ordinary skill in the art
Say, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Scope.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (10)
1. a kind of test system of multifrequency integrated power amplifier, it is characterised in that switch including signal generation apparatus, passage
Device and testing service device；
The testing service device connects the control end and the signal generation apparatus of the channel switching device respectively；It is described logical
The signal input part of road switching device connects the signal generation apparatus, and the channel switching device is provided with multiple signal outputs
End, each signal output part is respectively used to transmit the test signal of special frequency channel；
The testing service device reads the test target data of the multifrequency integrated power amplifier, according to the test target
The corresponding test cases of multifrequency integrated power amplifier described in data genaration, the read module test side from the test cases
Case, controls the channel switching device to connect the module testing scheme in multifrequency integration work(according to the module testing scheme
Corresponding TCH test channel in rate amplifier；The signal generation apparatus are driven to send rf excitation signal；And receive described many
Frequency integrated power amplifier receives the live signal fed back after the rf excitation signal；
The signal generation apparatus send rf excitation signal under the driving of testing service device；
The channel switching device connects the corresponding signal output part of the module testing scheme under the control of testing service device
Communication link between TCH test channel corresponding with module testing scheme in multifrequency integrated power amplifier.
2. the test system of multifrequency integrated power amplifier according to claim 1, it is characterised in that the test clothes
Business device reads the test target data of the multifrequency integrated power amplifier, is generated respectively according to the test target data many
Frequency integrated power amplifier each power amplifier module to be measured distinguishes corresponding module testing scheme, according to the module testing scheme
Generate the test cases of multifrequency integrated power amplifier.
3. the test system of multifrequency integrated power amplifier according to claim 2, it is characterised in that the test clothes
Business device recognizes the corresponding i-th module testing scheme of the i-th power amplifier module from the test cases, controls the channel switching device
The i-th TCH test channel of multifrequency integrated power amplifier is connected, according to the i-th module testing scheme driving signal generator
Rf excitation signal is sent, the i-th channel test signal of the multifrequency integrated power amplifier feedback is received；I is updated to i
+ 1, the operation of the i-th module testing scheme of identification is repeated, until each is surveyed to receive the multifrequency integrated power amplifier
Ping corresponding live signal；Wherein, the initial value of i is that the maximum of 1, i is N, and N is in multifrequency integrated power amplifier
Power amplifier module sum to be measured.
4. the test system of multifrequency integrated power amplifier according to claim 3, it is characterised in that the test clothes
Business device detects whether to have received the corresponding live signal of multifrequency integrated power amplifier each power amplifier module, if so, then distinguishing
Send initialization directive to signal generation apparatus and channel switching device；Signal generation apparatus and channel switching device basis respectively
The initialization directive carries out initialization process.
5. the test system of multifrequency integrated power amplifier according to claim 3, it is characterised in that the test clothes
Business device receives the i-th channel test signal of the multifrequency integrated power amplifier feedback, detects i-th channel test signal
Whether anomaly parameter is included, if so, then output abnormality cue.
6. the test system of multifrequency integrated power amplifier according to claim 3, it is characterised in that the test clothes
Business device recognizes that described each power amplifier module of multifrequency integrated power amplifier distinguishes corresponding live signal, recognizes each real-time letter
Number signal characteristic parameter, according to the signal characteristic parameter generate multifrequency integrated power amplifier test report.
7. the test system of the multifrequency integrated power amplifier according to claim 1 to 6, it is characterised in that also include
Frequency spectrograph, the input of the frequency spectrograph connects the signal output part of the multifrequency integrated power amplifier, the frequency spectrograph
Output end connect the testing service device, the frequency spectrograph is used for the real-time of multifrequency integrated power amplifier output
Signal carries out frequency-domain analysis, and the result that frequency-domain analysis is obtained is exported to testing service device.
8. the test system of multifrequency integrated power amplifier according to claim 7, it is characterised in that also including decay
Device, the attenuator is connected between the multifrequency integrated power amplifier and frequency spectrograph, and the attenuator is used for input
The live signal of frequency spectrograph carries out attenuation processing.
9. the test system of multifrequency integrated power amplifier according to claim 8, it is characterised in that also including power
Meter and coupler；The input of the coupler connects the output end of the attenuator, the output end connection institute of the coupler
The input of frequency spectrograph is stated, the coupled end of the coupler connects the testing service device by the power meter；
The coupler from pass through live signal in coupling obtain test signal component, by the test signal component export to
Power meter, the power meter measures the power parameter of the test signal component, and the power parameter is exported to test clothes
Business device.
10. the test system of the multifrequency integrated power amplifier according to claim 1 to 6, it is characterised in that the letter
Number generating means includes the first signal source, secondary signal source and combiner；The control end and secondary signal of first signal source
The control end difference connecting test server in source；The output end difference in the output end for stating the first signal source and secondary signal source
The signal input part of the channel switching device is connected by the combiner；
First signal source produces the first test signal to send to the combiner；The secondary signal source produces second to test
Signal is sent to the combiner, and first test signal and the second test signal are combined treatment by the combiner,
Obtain intermodulation signal and send the TCH test channel connected to the channel switching device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710157314.6A CN106872829A (en) | 2017-03-16 | 2017-03-16 | The test system of multifrequency integrated power amplifier |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710157314.6A CN106872829A (en) | 2017-03-16 | 2017-03-16 | The test system of multifrequency integrated power amplifier |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106872829A true CN106872829A (en) | 2017-06-20 |
Family
ID=59172412
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710157314.6A Pending CN106872829A (en) | 2017-03-16 | 2017-03-16 | The test system of multifrequency integrated power amplifier |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106872829A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108337054A (en) * | 2017-12-30 | 2018-07-27 | 京信通信系统（中国）有限公司 | Power calibrating method, system, computer equipment and storage medium |
| CN111707893A (en) * | 2020-06-19 | 2020-09-25 | 锐石创芯（深圳）科技有限公司 | Amplifier testing device |
| CN112083319A (en) * | 2020-09-25 | 2020-12-15 | 汉桑（南京）科技有限公司 | Power amplifier test method, system, device and storage medium |
| CN113014334A (en) * | 2020-11-03 | 2021-06-22 | 利尔达科技集团股份有限公司 | Test system and test method of UWB positioning module |
| CN116298497A (en) * | 2023-05-16 | 2023-06-23 | 合肥联宝信息技术有限公司 | Power detection method, device and system of electronic equipment and storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1399138A (en) * | 2001-07-20 | 2003-02-26 | 上海大唐移动通信设备有限公司 | RF automatic changing batch testing method |
| CN101183138A (en) * | 2007-11-29 | 2008-05-21 | 中兴通讯股份有限公司 | Batch detector methods and apparatus of power amplifier |
| CN101968529A (en) * | 2010-08-26 | 2011-02-09 | 芯通科技（成都）有限公司 | Amplifier test system |
| CN103560841A (en) * | 2013-10-28 | 2014-02-05 | 深圳市共进电子股份有限公司 | Radio frequency circuit testing system and method |
-
2017
- 2017-03-16 CN CN201710157314.6A patent/CN106872829A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1399138A (en) * | 2001-07-20 | 2003-02-26 | 上海大唐移动通信设备有限公司 | RF automatic changing batch testing method |
| CN101183138A (en) * | 2007-11-29 | 2008-05-21 | 中兴通讯股份有限公司 | Batch detector methods and apparatus of power amplifier |
| CN101968529A (en) * | 2010-08-26 | 2011-02-09 | 芯通科技（成都）有限公司 | Amplifier test system |
| CN103560841A (en) * | 2013-10-28 | 2014-02-05 | 深圳市共进电子股份有限公司 | Radio frequency circuit testing system and method |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108337054A (en) * | 2017-12-30 | 2018-07-27 | 京信通信系统（中国）有限公司 | Power calibrating method, system, computer equipment and storage medium |
| CN108337054B (en) * | 2017-12-30 | 2021-09-03 | 京信网络系统股份有限公司 | Power calibration method, system, computer device and storage medium |
| CN111707893A (en) * | 2020-06-19 | 2020-09-25 | 锐石创芯（深圳）科技有限公司 | Amplifier testing device |
| CN112083319A (en) * | 2020-09-25 | 2020-12-15 | 汉桑（南京）科技有限公司 | Power amplifier test method, system, device and storage medium |
| CN113014334A (en) * | 2020-11-03 | 2021-06-22 | 利尔达科技集团股份有限公司 | Test system and test method of UWB positioning module |
| CN113014334B (en) * | 2020-11-03 | 2022-08-12 | 利尔达科技集团股份有限公司 | Test system and test method of UWB positioning module |
| CN116298497A (en) * | 2023-05-16 | 2023-06-23 | 合肥联宝信息技术有限公司 | Power detection method, device and system of electronic equipment and storage medium |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106872829A (en) | The test system of multifrequency integrated power amplifier | |
| CN102946286B (en) | Method, device and system for controlling detection of equipment | |
| CN103731206B (en) | The test device of optical module communication bit error rates and sensitivity | |
| CN108387878A (en) | A kind of phased-array radar TR components automatic testing equipment and method | |
| CN109412720A (en) | System and method for detecting the passive intermodulation in cellular network (PIM) interference | |
| CN103516444B (en) | A kind of passive radio frequency identification system equipment receptivity test device | |
| CN109245836A (en) | A kind of test device and method of multi-path-apparatus | |
| CN108271188A (en) | The test system and test method of wireless router WiFi performances | |
| CN107547144B (en) | Radio frequency test system | |
| CN103840899A (en) | Automatic test device of transceiving assembly | |
| CN202794512U (en) | Sensitivity testing device of secondary radar digital receiver | |
| CN207283563U (en) | Bluetooth equipment radio frequency test system | |
| CN103376403B (en) | The reliability test system of digital pre-distorting power amplifier | |
| CN107359944B (en) | Bluetooth equipment radio frequency test system | |
| CN105281852B (en) | A kind of L-band test equipment and test method | |
| CN111707893A (en) | Amplifier testing device | |
| CN108322270A (en) | A kind of wireless radio frequency receivers sensitivity test method | |
| CN204349995U (en) | The full-automatic regulating and measuring system of a kind of GSM digital high-frequency amplification station | |
| CN105162530A (en) | System for detecting hardware performance of micropower wireless communication module | |
| CN108600929A (en) | A kind of multinomial audio frequency parameter automatic test approach and its test system | |
| CN207251564U (en) | A kind of high-power output system of adaptive amplitude-phase uniformity | |
| CN105656574B (en) | The detection device of NFC reader sensitivity | |
| KR20120124106A (en) | the performance analysis and self diagnosis device for the RF system of mobile telecommunication | |
| CN106405272A (en) | Radio frequency matrix testing apparatus of radio frequency power amplifier | |
| CN101997620B (en) | Device and method for providing test signals |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20180214 Address after: 510663 Shenzhou Road 10, Guangzhou Science City, Guangzhou economic and Technological Development Zone, Guangzhou, Guangdong Applicant after: Comba Telecom System (China) Co., Ltd. Applicant after: Comba Telecom Systems (Guangzhou) Co., Ltd. Applicant after: Jingxin Communication Technology (Guangzhou) Co., Ltd. Applicant after: TIANJIN COMBA TELECOM SYSTEMS CO., LTD. Address before: 510663 Guangdong city of Guangzhou province Guangzhou economic and Technological Development Zone Jinbi Road No. 6 Applicant before: Jingxin Communication Technology (Guangzhou) Co., Ltd. |
|
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20200108 Address after: 510663 Shenzhou Road 10, Guangzhou Science City, Guangzhou economic and Technological Development Zone, Guangzhou, Guangdong Applicant after: Jingxin Communication System (China) Co., Ltd. Address before: 510663 Shenzhou Road 10, Guangzhou Science City, Guangzhou economic and Technological Development Zone, Guangzhou, Guangdong Applicant before: Jingxin Communication System (China) Co., Ltd. Applicant before: Jingxin Communication System (Guangzhou) Co., Ltd. Applicant before: Jingxin Communication Technology (Guangzhou) Co., Ltd. Applicant before: TIANJIN COMBA TELECOM SYSTEMS CO., LTD. |
|
| TA01 | Transfer of patent application right | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170620 |
|
| RJ01 | Rejection of invention patent application after publication |