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This repository contains the notebooks that can reproduce the results presented in the paper "Classical and quantum regression analysis for the optoelectronic performance of NTCDA/p-Si UV photodiode"

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kareem1925/Classical-and-quantum-regression-analysis-for-the-optoelectronic-performance-of-NTCDA

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Classical-and-quantum-regression-analysis-for-the-optoelectronic-performance-of-NTCDA

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The optical absorbance of NTCDA thin film on a quartz substrate was measured at normal incidence of the light at room temperature in the spectral range of 190–2500 nm using a double beam spectrophotometer (JASCO model V-570 UV-VIS-NIR). The Photoelectrical properties – of the fabricated Au/NTCDA/p-Si/Al photodiode – were investigated by measuring the I-V characteristic curve at room temperature from +3.5 to -3.4, using Keithley electrometer model 6517B under the influence of UV light of wavelength 194 nm. The intensity of incident light was measured using Radiometer/Photometer model IL1400A.

Environment Setup

These are the packages used in the code development

pip install pennylane==0.10.0 strawberryfields==0.14.0 pennylane-sf==0.9.0 tensorflow==2.2.0 tpot==0.11.5 xgboost==0.90 keras

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Creative Commons License
This research is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.

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This repository contains the notebooks that can reproduce the results presented in the paper "Classical and quantum regression analysis for the optoelectronic performance of NTCDA/p-Si UV photodiode"

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