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a factory for convolve scanners that carry along either the full history (more general / less efficient) or cumulative incidence (less general / more efficient). That is needed to implement susceptibility adjustments that depend on keeping track of cumulative incidence (e.g. the logistic_susceptibility_adjustment)
The text was updated successfully, but these errors were encountered:
Mentioned as "out of scope" here: #161
The text was updated successfully, but these errors were encountered: